TY - GEN
T1 - Effect of surface morphology of a SiO2/Si reference electrode modified by ODMS on the responses to pH and ionic strength
AU - Wang, Jinping
AU - Sasano, Junji
AU - Osaka, Tetsuya
PY - 2009
Y1 - 2009
N2 - The purpose of this work was to study the effect of surface morphology on the responses to pH and ionic strength of a SiO2/Si reference electrode (RE) modified by octadecyltrimethoxysilane (ODMS). Representative REs with contact angles (CA) of 60°, 80° and 106° were studied in various solutions: those with combined effects of pH and ionic strength, those with ionic strength variation and constant pH, and those with pH variation and constant ionic strength. REs with the flat surface show response to ionic strength, while REs with the rough surface show response to pH. The reason may be that total ionic strength determines the charge and potential distribution in the electrolyte-insulator-semiconductor structure for REs with flat surfaces, but that the combined effects of uncovered binding sites, penetration of H + into pinholes, and the special adsorption of H+ dictate the charge and potential distribution for REs with rough surfaces.
AB - The purpose of this work was to study the effect of surface morphology on the responses to pH and ionic strength of a SiO2/Si reference electrode (RE) modified by octadecyltrimethoxysilane (ODMS). Representative REs with contact angles (CA) of 60°, 80° and 106° were studied in various solutions: those with combined effects of pH and ionic strength, those with ionic strength variation and constant pH, and those with pH variation and constant ionic strength. REs with the flat surface show response to ionic strength, while REs with the rough surface show response to pH. The reason may be that total ionic strength determines the charge and potential distribution in the electrolyte-insulator-semiconductor structure for REs with flat surfaces, but that the combined effects of uncovered binding sites, penetration of H + into pinholes, and the special adsorption of H+ dictate the charge and potential distribution for REs with rough surfaces.
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U2 - 10.1149/1.2981157
DO - 10.1149/1.2981157
M3 - Conference contribution
AN - SCOPUS:63849125271
SN - 9781566776578
T3 - ECS Transactions
SP - 507
EP - 515
BT - ECS Transactions - Chemical Sensors 8
PB - Electrochemical Society Inc.
T2 - Chemical Sensors 8: Chemical (Gas, Ion, Bio) Sensors and Analytical Systems - 214th ECS Meeting
Y2 - 12 October 2008 through 17 October 2008
ER -