TY - GEN
T1 - Effects of humidity and temperature on space charge distribution profiles in printed circuit board insulations
AU - Echigo, Yasutsune
AU - Tanaka, Hidesato
AU - Ohki, Yoshimichi
AU - Fukunaga, Kaori
AU - Maeno, Takashi
AU - Okamoto, Kenji
PY - 2007/12/1
Y1 - 2007/12/1
N2 - The properties of bulk insulation in printed circuit boards (PCBs) have become even more important, especially for those with a multilayered or embedded structure. In particular, the spatial distribution of internal charge carriers, mainly due to ionic impurities, is thought to affect the reliability of bulk insulation. Therefore, the effects of humidity and temperature on space charge distribution profiles in a five-layered composite of aramid paper and epoxy resin are studied in this paper. More charge carriers are induced at higher temperatures with humidity. A relative humidity of 55% is high enough to induce a saturated amount of charge carriers in the present samples at 40°C.
AB - The properties of bulk insulation in printed circuit boards (PCBs) have become even more important, especially for those with a multilayered or embedded structure. In particular, the spatial distribution of internal charge carriers, mainly due to ionic impurities, is thought to affect the reliability of bulk insulation. Therefore, the effects of humidity and temperature on space charge distribution profiles in a five-layered composite of aramid paper and epoxy resin are studied in this paper. More charge carriers are induced at higher temperatures with humidity. A relative humidity of 55% is high enough to induce a saturated amount of charge carriers in the present samples at 40°C.
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U2 - 10.1109/ICSD.2007.4290850
DO - 10.1109/ICSD.2007.4290850
M3 - Conference contribution
AN - SCOPUS:47349115727
SN - 1424407516
SN - 9781424407514
T3 - 2007 International Conference on Solid Dielectrics, ICSD
SP - 458
EP - 461
BT - 2007 International Conference on Solid Dielectrics, ICSD
T2 - 2007 International Conference on Solid Dielectrics, ICSD
Y2 - 8 July 2007 through 13 July 2007
ER -