Effects of internal micro-defects on diamond tool wear in precision cutting - Micro FT-IR analysis of internal micro-defects at the tool edge
T. Kaneeda, H. Torigoe, S. Shimada, K. Obata, L. Anthony, H. Iwashita
研究成果: Conference contribution
T. Kaneeda, H. Torigoe, S. Shimada, K. Obata, L. Anthony, H. Iwashita
研究成果: Conference contribution