抄録
The authors report the effects of nonradiative recombination on the properties of spatially localized excitons in InGaN quantum well structures studied using a microphotoluminescence (PL) technique. Sharp PL lines (linewidth of less than 1 meV) are clearly obtained by combining the PL and nanolithographic techniques. The PL originates from localized excitons induced by quantum-dot-like local potential minima where indium is accumulated. A systematic study with various kinds of samples reveals that suppressing the density of the nonradiative centers is crucially important in terms of observing the exciton localization effects rather than increasing the effects of indium accumulation.
本文言語 | English |
---|---|
論文番号 | 222110 |
ジャーナル | Applied Physics Letters |
巻 | 89 |
号 | 22 |
DOI | |
出版ステータス | Published - 2006 |
外部発表 | はい |
ASJC Scopus subject areas
- 物理学および天文学(その他)