TY - JOUR
T1 - Electronic states of sulfur vacancies formed on a MoS2 surface
AU - Kodama, Nagisa
AU - Hasegawa, Tsuyoshi
AU - Okawa, Yuji
AU - Tsuruoka, Tohru
AU - Joachim, Christian
AU - Aono, Masakazu
PY - 2010/8
Y1 - 2010/8
N2 - Sulfur vacancies formed on a MoS2 surface have been predicted to have electronic states at the Fermi level, and to work as conductive atomic scale structures. We made sulfur vacancies on a MoS2 surface by removing sulfur atoms using scanning tunneling microscopy (STM) induced field evaporation, and measured the current-voltage (I/V) characteristics of the vacancies. The I/V curve measured at the vacancies showed a linear increase at a zero bias region, indicating the existence of electronic states at the Fermi level. On the other hand, the I/V curve measured at a clean surface showed a gap of about 1 eV around the Fermi level, as was expected from the theoretical calculation. We also successfully carried out manipulation of Au nanoislands, which will be used as nanopads to be connected to a sulfur vacancy chain.
AB - Sulfur vacancies formed on a MoS2 surface have been predicted to have electronic states at the Fermi level, and to work as conductive atomic scale structures. We made sulfur vacancies on a MoS2 surface by removing sulfur atoms using scanning tunneling microscopy (STM) induced field evaporation, and measured the current-voltage (I/V) characteristics of the vacancies. The I/V curve measured at the vacancies showed a linear increase at a zero bias region, indicating the existence of electronic states at the Fermi level. On the other hand, the I/V curve measured at a clean surface showed a gap of about 1 eV around the Fermi level, as was expected from the theoretical calculation. We also successfully carried out manipulation of Au nanoislands, which will be used as nanopads to be connected to a sulfur vacancy chain.
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U2 - 10.1143/JJAP.49.08LB01
DO - 10.1143/JJAP.49.08LB01
M3 - Article
AN - SCOPUS:78049327666
SN - 0021-4922
VL - 49
JO - Japanese journal of applied physics
JF - Japanese journal of applied physics
IS - 8 PART 4
M1 - 08LB01
ER -