TY - GEN
T1 - Exact and fast L1 cache configuration simulation for embedded systems with FIFO/PLRU cache replacement policies
AU - Tawada, Masashi
AU - Yanagisawa, Masao
AU - Ohtsuki, Tatsuo
AU - Togawa, Nozomu
PY - 2011/6/28
Y1 - 2011/6/28
N2 - Since target applications in embedded systems are limited, we can optimize its cache configuration. A very fast and exact cache simulation algorithm, CRCB, has been recently proposed. CRCB assumes LRU as a cache replacement policy but FIFO- or PLRU-based cache is often used due to its low hardware cost. This paper proposes exact and fast L1 cache simulation algorithms for PLRU- or FIFO-based caches. First, we prove that CRCB can be applied to FIFO and PLRU. Next, we show several properties for FIFO- and PLRU-based caches and propose their associated cache-simulation speed-up algorithms. Experiments demonstrate that our algorithms run up to 300 times faster than a well-known cache simulator.
AB - Since target applications in embedded systems are limited, we can optimize its cache configuration. A very fast and exact cache simulation algorithm, CRCB, has been recently proposed. CRCB assumes LRU as a cache replacement policy but FIFO- or PLRU-based cache is often used due to its low hardware cost. This paper proposes exact and fast L1 cache simulation algorithms for PLRU- or FIFO-based caches. First, we prove that CRCB can be applied to FIFO and PLRU. Next, we show several properties for FIFO- and PLRU-based caches and propose their associated cache-simulation speed-up algorithms. Experiments demonstrate that our algorithms run up to 300 times faster than a well-known cache simulator.
UR - http://www.scopus.com/inward/record.url?scp=79959533889&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79959533889&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2011.5783622
DO - 10.1109/VDAT.2011.5783622
M3 - Conference contribution
AN - SCOPUS:79959533889
SN - 9781424484997
T3 - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
SP - 247
EP - 250
BT - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
T2 - 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
Y2 - 25 April 2011 through 28 April 2011
ER -