Fabrication of diamond MISFET with micron-sized gate length on boron-doped (111) surface
Takeyasu Saito*, Kyung Ho Park, Kazuyuki Hirama, Hitoshi Umezawa, Mitsuya Satoh, Hiroshi Kawarada, Hideyo Okushi
*この研究の対応する著者
研究成果: Conference article › 査読
11
被引用数
(Scopus)