TY - JOUR
T1 - Fabrication of Passive Thin Film Capacitor by Using Semiconductor Technology
AU - Koiwa, Ichiro
AU - Ashikaga, Kinya
AU - Terui, Makoto
AU - Shiraishi, Yasushi
AU - Anzai, Noritaka
AU - Ohsumi, Takashi
AU - Osaka, Tetsuya
AU - Kumagai, Tomoya
AU - Sato, Yoshimi
AU - Hashimoto, Akira
N1 - Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2005
Y1 - 2005
N2 - Recently, there has been a strong demand for smaller electronic devices with improved. About 60% of the area is occupied by the passive components for packaging. To overcome this limitation, an embedded capacitor was prepared using semiconductor technologies and the process technology of ferroelectric random access memories. Eight micro capacitors were prepared in a 2 mm2area. Two types of high dielectric constant material were used. The first one is Barium Strontium Titanium oxide (BST) for focusing high capacitance with high loss, and the other is Strontium Bismath Tantalum oxide (SBT) for focusing low loss with medium capacitance. The micro capacitor with BST, whose dielectric constant (ε) was 350, showed about 3200 pF at 0 bias and its loss, tanδ, was a little lower than 0. 01. The one with SBT, whose e was 51, showed 470 pF, and its tan δ was about 0. 001. It is concluded that micro capacitors with the requested characteristics were prepared.
AB - Recently, there has been a strong demand for smaller electronic devices with improved. About 60% of the area is occupied by the passive components for packaging. To overcome this limitation, an embedded capacitor was prepared using semiconductor technologies and the process technology of ferroelectric random access memories. Eight micro capacitors were prepared in a 2 mm2area. Two types of high dielectric constant material were used. The first one is Barium Strontium Titanium oxide (BST) for focusing high capacitance with high loss, and the other is Strontium Bismath Tantalum oxide (SBT) for focusing low loss with medium capacitance. The micro capacitor with BST, whose dielectric constant (ε) was 350, showed about 3200 pF at 0 bias and its loss, tanδ, was a little lower than 0. 01. The one with SBT, whose e was 51, showed 470 pF, and its tan δ was about 0. 001. It is concluded that micro capacitors with the requested characteristics were prepared.
KW - Barium Strontium Titanium Oxide (BST)
KW - Passive
KW - Semiconductor Process Technology
KW - Strontium Bismath Tantalum Oxide (SBT)
KW - Thin Film Capacitor
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U2 - 10.5104/jiep.8.517
DO - 10.5104/jiep.8.517
M3 - Article
AN - SCOPUS:85009638111
SN - 1343-9677
VL - 8
SP - 517
EP - 522
JO - Journal of The Japan Institute of Electronics Packaging
JF - Journal of The Japan Institute of Electronics Packaging
IS - 6
ER -