TY - GEN
T1 - Fast polar and spherical fourier descriptors for feature extraction
AU - Yang, Zhuo
AU - Kamata, Sei Ichiro
PY - 2010/11/18
Y1 - 2010/11/18
N2 - Polar Fourier Descriptor(PFD) and Spherical Fourier Descriptor(SFD) are rotation invariant feature descriptors for two dimensional(2D) and three dimensional(3D) image retrieval and pattern recognition tasks. They are demonstrated to show superiorities compared with other methods on describing rotation invariant features of 2D and 3D images. However in order to increase the computation speed, fast computation method is needed especially for applications like realtime systems and large image databases. This paper presents fast computation method for PFD and SFD that based on mathematical properties of trigonometric functions and associated Legendre polynomials. Proposed fast PFD and SFD are 8 and 16 times faster than traditional ones that significantly boost computation process.
AB - Polar Fourier Descriptor(PFD) and Spherical Fourier Descriptor(SFD) are rotation invariant feature descriptors for two dimensional(2D) and three dimensional(3D) image retrieval and pattern recognition tasks. They are demonstrated to show superiorities compared with other methods on describing rotation invariant features of 2D and 3D images. However in order to increase the computation speed, fast computation method is needed especially for applications like realtime systems and large image databases. This paper presents fast computation method for PFD and SFD that based on mathematical properties of trigonometric functions and associated Legendre polynomials. Proposed fast PFD and SFD are 8 and 16 times faster than traditional ones that significantly boost computation process.
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U2 - 10.1109/ICPR.2010.244
DO - 10.1109/ICPR.2010.244
M3 - Conference contribution
AN - SCOPUS:78149489321
SN - 9780769541099
T3 - Proceedings - International Conference on Pattern Recognition
SP - 975
EP - 978
BT - Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
T2 - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Y2 - 23 August 2010 through 26 August 2010
ER -