TY - GEN
T1 - Force sensor based on metal nanoparticle
AU - Koyama, Asuto
AU - Kan, Tetsuo
AU - Iwase, Eiji
AU - Matsumoto, Kiyoshi
AU - Shimoyama, Isao
PY - 2010/6/1
Y1 - 2010/6/1
N2 - We propose a force sensor based on gold nanoparticles, which enable optical detection of force by measurement of the scattering light spectrum. Gold nanoparticles were dispersed on an elastomer sheet. The scattering spectrum changes due to strain were observed to investigate applicability of the sensor to force measurement. The force deforms the elastomer sensor body, and increases the interparticle distance of gold nanoparticles on the sheet. The increase of the interparticle distance gives rise to the scattering characteristic changes. We fabricated a prototype sensor using PDMS sheet and 40 nm of diameter gold nanoparticles. It was demonstrated that 21% strain induced 60% increase of scattering intensity of gold nanoparticles.
AB - We propose a force sensor based on gold nanoparticles, which enable optical detection of force by measurement of the scattering light spectrum. Gold nanoparticles were dispersed on an elastomer sheet. The scattering spectrum changes due to strain were observed to investigate applicability of the sensor to force measurement. The force deforms the elastomer sensor body, and increases the interparticle distance of gold nanoparticles on the sheet. The increase of the interparticle distance gives rise to the scattering characteristic changes. We fabricated a prototype sensor using PDMS sheet and 40 nm of diameter gold nanoparticles. It was demonstrated that 21% strain induced 60% increase of scattering intensity of gold nanoparticles.
UR - http://www.scopus.com/inward/record.url?scp=77952761286&partnerID=8YFLogxK
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U2 - 10.1109/MEMSYS.2010.5442475
DO - 10.1109/MEMSYS.2010.5442475
M3 - Conference contribution
AN - SCOPUS:77952761286
SN - 9781424457649
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 428
EP - 431
BT - MEMS 2010 - The 23rd IEEE International Conference on Micro Electro Mechanical Systems, Technical Digest
T2 - 23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010
Y2 - 24 January 2010 through 28 January 2010
ER -