抄録
A ZnSe-ZnTe strained-layer superlattice (SLS) was grown on an InP substrate by molecular beam epitaxy for the first time. The x-ray diffraction measurement technique was used to confirm the existence of the high quality SLS structure. Overall quality may also be inferred from the observed quantum size effects of the photoluminescence data.
本文言語 | English |
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ページ(範囲) | 296-297 |
ページ数 | 2 |
ジャーナル | Applied Physics Letters |
巻 | 48 |
号 | 4 |
DOI | |
出版ステータス | Published - 1986 |
外部発表 | はい |
ASJC Scopus subject areas
- 物理学および天文学(その他)