Improved method for evaluation of dielectric breakdown strength of epoxy / silica nanocomposite thin films
Yusuke Kida*, Rina Sankawa, Kohei Takahashi, Shuhei Yamamoto, Takanobu Watanabe, Kotaro Mura, Yoshihiro Ohgashi, Tetsuo Yoshimitsu, Takahiro Imai
*この研究の対応する著者
研究成果: Conference contribution