Improved method for evaluation of dielectric breakdown strength of epoxy / silica nanocomposite thin films

Yusuke Kida^*, Rina Sankawa, Kohei Takahashi, Shuhei Yamamoto, Takanobu Watanabe, Kotaro Mura, Yoshihiro Ohgashi, Tetsuo Yoshimitsu, Takahiro Imai

^*この研究の対応する著者