In situ Ru K-edge X-ray absorption spectroscopy of a high-area ruthenium dioxide electrode in a Nafion-based supercapacitor environment

Yibo Mo, In Tae Bae, S. Sarangapani, Daniel Alberto Scherson*

*この研究の対応する著者

研究成果: Article査読

11 被引用数 (Scopus)

抄録

Changes in the state of charge of a high-area RuOx electrode in an operating RuOx|Nafion|IrOx supercapacitor were monitored in situ by time-resolved, transmission Ru K-edge X-ray absorption spectroscopy (XAS). Linear and reversible variations in the intensity of the transmitted X-ray beam as a function of time were found by fixing the energy of the incident X-ray beam, Ei, at judiciously selected values within the Ru K-edge X-ray near edge structure (XANES), while the supercapacitor was charged and discharged at constant current. The sign of the slope of these temporal signals was found to vary, depending on the value of Ei. This behavior could be rationalized based on the spectral differences between the Ru K-edge XANES of RuOx in the fully oxidized and fully reduced states, recorded in situ from films of the material electrodeposited on a gold substrate in the fluorescence mode.

本文言語English
ページ(範囲)572-575
ページ数4
ジャーナルJournal of Solid State Electrochemistry
7
9
DOI
出版ステータスPublished - 2003 9月 1
外部発表はい

ASJC Scopus subject areas

  • 材料科学(全般)
  • 凝縮系物理学
  • 電気化学
  • 電子工学および電気工学

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