In Situ Scanning Tunneling Microscopy Observation of Electroless-Deposited NiP Film

Takayuki Homma*, Takuya Yamazaki, Toshimoto Kubota, Tetsuya Osaka

*この研究の対応する著者

研究成果: Article査読

6 被引用数 (Scopus)

抄録

Preliminary results of an in situ scanning tunneling microscopy (STM) observation of electroless-deposited NiP film as well as that of electrodeposited film were demonstrated. The electroless-deposited film is observed to develop rough features consisting of small grains, suggesting the successive nucleation of the grains and their three-dimensional growth. The electro-deposited film, in contrast, consists of larger grains with smooth features.

本文言語English
ページ(範囲)L2114-L2117
ジャーナルJapanese journal of applied physics
29
11
DOI
出版ステータスPublished - 1990 11月

ASJC Scopus subject areas

  • 工学一般
  • 物理学および天文学一般

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