抄録
The stress of the electrodeposited pure Sn and the Ni-62 atom % Sn alloy thin film electrodes during cycling was measured in situ using an optical cantilever method. The results revealed that the Ni-62 atom % Sn alloy electrode with better cycle endurance actually experiences larger stress compared to the pure Sn electrode. Furthermore, the stress-release phenomenon during the open-circuit period has been confirmed for the first time. This paper demonstrates that the cantilever bending method is effective for the in situ study of the stress development, transition, and hence the phenomena taking place within the Sn-based electrodes.
本文言語 | English |
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ページ(範囲) | A70-A73 |
ジャーナル | Electrochemical and Solid-State Letters |
巻 | 10 |
号 | 3 |
DOI | |
出版ステータス | Published - 2007 2月 5 |
ASJC Scopus subject areas
- 化学工学(全般)
- 材料科学(全般)
- 物理化学および理論化学
- 電気化学
- 電子工学および電気工学