In-situ Trojan authentication for invalidating hardware-Trojan functions

研究成果: Conference contribution

6 被引用数 (Scopus)

抄録

Due to the fact that we do not know who will create hardware Trojans (HTs), and when and where they would be inserted, it is very difficult to correctly and completely detect all the real HTs in untrusted ICs, and thus it is desired to incorporate in-situ HT invalidating functions into untrusted ICs as a countermeasure against HTs. This paper proposes an in-situ Trojan authentication technique for gate-level netlists to avoid security leakage. In the proposed approach, an untrusted IC operates in authentication mode and normal mode. In the authentication mode, an embedded Trojan authentication circuit monitors the bit-flipping count of a suspicious Trojan net within the pre-defined constant clock cycles and identify whether it is a real Trojan or not. If the authentication condition is satisfied, the suspicious Trojan net is validated. Otherwise, it is invalidated and HT functions are masked. By doing this, even untrusted netlists with HTs can still be used in the normal mode without security leakage. By setting the appropriate authentication condition using training sets from Trust-HUB gate-level benchmarks, the proposed technique invalidates successfully only HTs in the training sets. Furthermore, by embedding the in-situ Trojan authentication circuit into a Trojan-inserted AES crypto netlist, it can run securely and correctly even if HTs exist where its area overhead is just 1.5% with no delay overhead.

本文言語English
ホスト出版物のタイトルProceedings of the 17th International Symposium on Quality Electronic Design, ISQED 2016
出版社IEEE Computer Society
ページ152-157
ページ数6
ISBN(電子版)9781509012138
DOI
出版ステータスPublished - 2016 5月 25
イベント17th International Symposium on Quality Electronic Design, ISQED 2016 - Santa Clara, United States
継続期間: 2016 3月 152016 3月 16

出版物シリーズ

名前Proceedings - International Symposium on Quality Electronic Design, ISQED
2016-May
ISSN(印刷版)1948-3287
ISSN(電子版)1948-3295

Other

Other17th International Symposium on Quality Electronic Design, ISQED 2016
国/地域United States
CitySanta Clara
Period16/3/1516/3/16

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ
  • 電子工学および電気工学
  • 安全性、リスク、信頼性、品質管理

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