TY - JOUR
T1 - Intensity estimation of He+-ion-induced F Kα doubly ionized X-ray satellites emitted from alkali and alkaline-earth fluorides
AU - Uda, M.
AU - Yamamoto, T.
AU - Takenaga, T.
AU - Mochizuki, M.
AU - Mukoyama, T.
PY - 1999/4/2
Y1 - 1999/4/2
N2 - F Kα satellite intensity distributions induced by He+ impacts were successfully explained, with the aid of those induced by photon impacts, by the shake-off and the resonant orbital rearrangement together with the direct coulomb interaction, molecular orbital formation, the energy loss of projectiles and the self-absorption of emitted X-rays. Here photon-induced F Kα spectra were emitted from a series of alkali and alkaline-earth fluorides, i.e., NaF, KF, RbF and CsF, and MgF2, CaF2, SrF2 and BaF2. This kind of semi-empirical calculation suggests that significant change in fine structures on the F Kα satellites is useful to specify bonding characteristics of these fluorides.
AB - F Kα satellite intensity distributions induced by He+ impacts were successfully explained, with the aid of those induced by photon impacts, by the shake-off and the resonant orbital rearrangement together with the direct coulomb interaction, molecular orbital formation, the energy loss of projectiles and the self-absorption of emitted X-rays. Here photon-induced F Kα spectra were emitted from a series of alkali and alkaline-earth fluorides, i.e., NaF, KF, RbF and CsF, and MgF2, CaF2, SrF2 and BaF2. This kind of semi-empirical calculation suggests that significant change in fine structures on the F Kα satellites is useful to specify bonding characteristics of these fluorides.
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U2 - 10.1016/S0168-583X(98)01088-X
DO - 10.1016/S0168-583X(98)01088-X
M3 - Conference article
AN - SCOPUS:0033515219
SN - 0168-583X
VL - 150
SP - 50
EP - 54
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
IS - 1-4
T2 - Proceedings of the 1998 8th International Conference on PIXE and its Analytical Applications
Y2 - 14 June 1998 through 18 June 1998
ER -