Josephson plasma frequencies in overdoped (formula presented)

H. Shibata, A. Matsuda

研究成果: Article査読

20 被引用数 (Scopus)

抄録

Far-infrared sphere resonance in (Formula presented) samples with various oxygen concentrations is measured down to (Formula presented) Although no peaks are observed in this frequency range for the optimumly doped sample, the Josephson plasma peak is observed at (Formula presented) for a (Formula presented)-annealed sample. The peak shifts to higher frequencies as the doping increases, and is observed at (Formula presented) for a (Formula presented)-annealed sample. The c-axis penetration depth (Formula presented) obtained from the peak frequencies is determined to be 77 to (Formula presented) These large (Formula presented) values are larger than the value estimated from the Josephson-coupled layer model, while the doping dependence is qualitatively explained by the model.

本文言語English
ページ(範囲)R11672-R11674
ジャーナルPhysical Review B - Condensed Matter and Materials Physics
59
18
DOI
出版ステータスPublished - 1999
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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