TY - GEN
T1 - Low-cost IP core test using multiple-mode loading scan chain and scan chain clusters
AU - Zeng, Gang
AU - Shi, Youhua
AU - Takabatake, Toshinori
AU - Yanagisawa, Masao
AU - Ito, Hideo
PY - 2006
Y1 - 2006
N2 - A fixing-shifting encoding (FSE) method is proposed to reduce test cost of IP cores. The FSE method reduces test cost by supporting multiple-mode loading test data, i.e., parallel loading, left-direction, and right-direction serial loading for each test slice data. Furthermore, the FSE that utilizes only two test channels can support a large number of internal scan chains and achieve further reduction in test cost by combining with scan chain clustering method. As a non-intrusive and automatic test pattern generation (ATPG) independent solution, the approach is applicable to IP core testing because it requires neither redesign of the core under test (CUT) nor running any additional ATPG for the encoding procedure. In addition, the decoder has low hardware overhead, and its design is independent of the CUT. Experimental results for some large ISCAS 89 benchmarks and an industry ASIC design have proven the efficiency of the proposed approach.
AB - A fixing-shifting encoding (FSE) method is proposed to reduce test cost of IP cores. The FSE method reduces test cost by supporting multiple-mode loading test data, i.e., parallel loading, left-direction, and right-direction serial loading for each test slice data. Furthermore, the FSE that utilizes only two test channels can support a large number of internal scan chains and achieve further reduction in test cost by combining with scan chain clustering method. As a non-intrusive and automatic test pattern generation (ATPG) independent solution, the approach is applicable to IP core testing because it requires neither redesign of the core under test (CUT) nor running any additional ATPG for the encoding procedure. In addition, the decoder has low hardware overhead, and its design is independent of the CUT. Experimental results for some large ISCAS 89 benchmarks and an industry ASIC design have proven the efficiency of the proposed approach.
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U2 - 10.1109/DFT.2006.41
DO - 10.1109/DFT.2006.41
M3 - Conference contribution
AN - SCOPUS:38749084929
SN - 076952706X
SN - 9780769527062
T3 - Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
SP - 136
EP - 144
BT - Proceedings - 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT'06
T2 - 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Y2 - 4 October 2006 through 6 October 2006
ER -