Low-cost IP core test using multiple-mode loading scan chain and scan chain clusters

Gang Zeng*, Youhua Shi, Toshinori Takabatake, Masao Yanagisawa, Hideo Ito

*この研究の対応する著者

研究成果: Conference contribution

2 被引用数 (Scopus)

抄録

A fixing-shifting encoding (FSE) method is proposed to reduce test cost of IP cores. The FSE method reduces test cost by supporting multiple-mode loading test data, i.e., parallel loading, left-direction, and right-direction serial loading for each test slice data. Furthermore, the FSE that utilizes only two test channels can support a large number of internal scan chains and achieve further reduction in test cost by combining with scan chain clustering method. As a non-intrusive and automatic test pattern generation (ATPG) independent solution, the approach is applicable to IP core testing because it requires neither redesign of the core under test (CUT) nor running any additional ATPG for the encoding procedure. In addition, the decoder has low hardware overhead, and its design is independent of the CUT. Experimental results for some large ISCAS 89 benchmarks and an industry ASIC design have proven the efficiency of the proposed approach.

本文言語English
ホスト出版物のタイトルProceedings - 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT'06
ページ136-144
ページ数9
DOI
出版ステータスPublished - 2006
イベント2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, United States
継続期間: 2006 10月 42006 10月 6

出版物シリーズ

名前Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISSN(印刷版)1550-5774

Conference

Conference2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
国/地域United States
CityArlington, VA
Period06/10/406/10/6

ASJC Scopus subject areas

  • 工学(全般)

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