Low-frequency Raman scattering in binary silicate glass: Boson peak frequency and its general expression

Kensaku Nakamura, Yoshihiro Takahashi*, Minoru Osada, Takumi Fujiwara

*この研究の対応する著者

研究成果: Article査読

11 被引用数 (Scopus)

抄録

Low-frequency Raman measurement was performed in alkali and alkaline-earth silicate glasses to elucidate the effect of introduction of network modifiers on boson peak nature. Our study illustrated that introduction of small/medium ions tended to increase in the boson peak frequency (ωBP), whereas the introduction of large ions tended to decrease the frequency. Although ωBP has been suggested to be proportional to the shear modulus, no linear relationship was obtained in these binary systems. Instead, we experimentally demonstrated that mean atomic volume can explain variations in ωBP regardless of the trend of boson peaks.

本文言語English
ページ(範囲)1012-1014
ページ数3
ジャーナルNippon Seramikkusu Kyokai Gakujutsu Ronbunshi/Journal of the Ceramic Society of Japan
121
1420
DOI
出版ステータスPublished - 2013 12月
外部発表はい

ASJC Scopus subject areas

  • セラミックおよび複合材料
  • 材料化学
  • 化学 (全般)
  • 凝縮系物理学

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