Low power test compression technique for designs with multiple scan chains

This paper presents a new DFT technique that can significantly reduce test data volume as well as scan-in power consumption for multiscan-based designs. It can also help to reduce test time and tester channel requirements with small hardware overhead. In the proposed approach, we start with apre-computed test cube set and fill the don't-cares with proper values for joint reduction of test data volume and scan power consumption. In addition we explore the linear dependencies of the scan chains to construct a fanout structure only with inverters to achieve further compression. Experimental results for the larger ISCAS'89 benchmarks show the efficiency of the proposed technique.