抄録
ZnTe epilayers were grown on transparent (10-10) oriented (m -plane) sapphire substrates by molecular beam epitaxy (MBE). Pole figure imaging was used to study the domain distribution within the layer. (211)-oriented ZnTe domains were formed on m -plane sapphire. The presence of only one kind of (211) ZnTe domain formed on the 2°-tilted m -plane sapphire substrates was confirmed. Thus, single domain (211) ZnTe epilayers can be grown on the m -plane sapphire using MBE. Although differences in the crystal structure and lattice mismatch are large, precise control of the substrate surface lattice arrangement result in the formation of high-quality epitaxial layers.
本文言語 | English |
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ページ(範囲) | 1182-1185 |
ページ数 | 4 |
ジャーナル | Physica Status Solidi (C) Current Topics in Solid State Physics |
巻 | 11 |
号 | 7-8 |
DOI | |
出版ステータス | Published - 2014 7月 |
ASJC Scopus subject areas
- 凝縮系物理学