Microscopic Analysis of Dynamic Loading-induced Fractures by Using Micro CT

Mitsuhiro Yokota*, S. H. Cho, M. Ito, S. Owada, K. Kaneko

*この研究の対応する著者

研究成果: Chapter

抄録

The purpose of this study is to reveal the mechanism of the high-voltage electric pulsed test. The artificial samples were tested by the high-voltage electric pulsed test. Toestimate the current path and analyze the fractures at grain boundaries, the samples were observed by using Micro CT, before and after the test. The fracture patterns were divided into 2 types, being the "multi fracture pattern" and the "single fracture pattern".

本文言語English
ホスト出版物のタイトルAdvances in X-ray Tomography for Geomaterials
出版社Wiley-ISTE
ページ237-243
ページ数7
ISBN(印刷版)1905209606, 9781905209606
DOI
出版ステータスPublished - 2010 1月 22

ASJC Scopus subject areas

  • 材料科学(全般)

フィンガープリント

「Microscopic Analysis of Dynamic Loading-induced Fractures by Using Micro CT」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル