抄録
In this paper, we report a non-invasive and nondestructive probing method for analyzing the MG63 osteoblast-like cells. High-frequency Microwave atomic force microscope (M-AFM) can sense the topography and microwave image of MG63 cells simultaneously in one scanning process. Under the frequency modulation (FM) AFM mode, this powerful instrument is applied successfully to create a microwave image of MG63 cells with nanometer-scale spatial resolution. By analyzing the results, quantification such as, the number and distribution of organelles and proteins of MG63 cells as well as their dimension and electrical property information can be characterized.
本文言語 | English |
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ホスト出版物のタイトル | DTIP 2014 - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS |
出版社 | Institute of Electrical and Electronics Engineers Inc. |
ISBN(印刷版) | 9782355000287 |
DOI | |
出版ステータス | Published - 2014 3月 9 |
外部発表 | はい |
イベント | 2014 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2014 - Cannes, France 継続期間: 2014 4月 2 → 2014 4月 4 |
Other
Other | 2014 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2014 |
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国/地域 | France |
City | Cannes |
Period | 14/4/2 → 14/4/4 |
ASJC Scopus subject areas
- コンピュータ グラフィックスおよびコンピュータ支援設計
- コンピュータ サイエンスの応用
- ハードウェアとアーキテクチャ