TY - JOUR
T1 - Molecular beam epitaxy of gap and GaAs1−xPx
AU - Matsushima, Yuichi
AU - Gonda, Shunichi
PY - 1976
Y1 - 1976
N2 - GaP and GaAs1−xPx single crystal thin films were successfully grown on (100)-oriented GaP substrates by molecular beam epitaxy. At lower substrate temperatures these materials have a tendency to grow in pyramidal forms. However, at substrate temperatures of 560-600 °C, single crystalline films with high crystallographic quality and flat surfaces are grown at the intensity ratio of molecular beams, P/Ga, of about 100. The composition ratio x of GaAs1−xPx is dependent on the substrate temperature, Ts, and the intensity ratio P/As. The rate of decrease,-dx/dTs, is found to be 0.003 °C−1 for the entire composition-ratio range.
AB - GaP and GaAs1−xPx single crystal thin films were successfully grown on (100)-oriented GaP substrates by molecular beam epitaxy. At lower substrate temperatures these materials have a tendency to grow in pyramidal forms. However, at substrate temperatures of 560-600 °C, single crystalline films with high crystallographic quality and flat surfaces are grown at the intensity ratio of molecular beams, P/Ga, of about 100. The composition ratio x of GaAs1−xPx is dependent on the substrate temperature, Ts, and the intensity ratio P/As. The rate of decrease,-dx/dTs, is found to be 0.003 °C−1 for the entire composition-ratio range.
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U2 - 10.1143/JJAP.15.2093
DO - 10.1143/JJAP.15.2093
M3 - Article
SN - 0021-4922
VL - 15
SP - 2093
EP - 2101
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 11
ER -