TY - JOUR
T1 - Nonscalability of alpha-particle-induced charge collection area
AU - Tanii, T.
AU - Matsukawa, T.
AU - Mori, Sh
AU - Koh, M.
AU - Shigeta, B.
AU - Igarashi, K.
AU - Ohdomari, I.
N1 - Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 1996
Y1 - 1996
N2 - The scalability of alpha-particle-induced soft errors has been evaluated. We have irradiated individual sites in and near a PN-junction area with single alpha particles and measured the charge collected at the junction. As the PN-junction size is reduced, the charge collected by diffusion upon the incidence of alpha particles at the outer area around the junction increases relative to the charge collected upon direct incidence at the junction area. This suggests that the soft-error- sensitive area is not scaled down even if memory cell size is reduced.
AB - The scalability of alpha-particle-induced soft errors has been evaluated. We have irradiated individual sites in and near a PN-junction area with single alpha particles and measured the charge collected at the junction. As the PN-junction size is reduced, the charge collected by diffusion upon the incidence of alpha particles at the outer area around the junction increases relative to the charge collected upon direct incidence at the junction area. This suggests that the soft-error- sensitive area is not scaled down even if memory cell size is reduced.
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U2 - 10.1143/jjap.35.l688
DO - 10.1143/jjap.35.l688
M3 - Article
AN - SCOPUS:0030171612
SN - 0021-4922
VL - 35
SP - L688-L690
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - 6 A
ER -