We have been developing a no-insulation (NI) REBCO pancake coil technology for applications in medical cyclotrons and high-field whole-body MRI. The thermal and electromagnetic behaviors of multi-stacked NI-REBCO double pancake coils are numerically analyzed in this study when a local defect occurs in one coil using coil diameter and operating temperature parameters. Based on changes in voltage at both ends of the coil and the magnetic field at the center, we present a numerical study of the possibility of continuous operation after the occurrence of a local defect. In the numerical analysis, a new simplified model based on the PEEC model (Partial Element Equivalent Circuit model) is suggested and used for current distribution analysis, and the results are compared.
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