Numerical prediction of fraction of eutectic phase in Sn-Ag-Cu soldering using the phase-field method

Machiko Ode*, Minoru Ueshima, Taichi Abe, Hideyuki Murakami, Hidehiro Onodera

*この研究の対応する著者

研究成果: Article査読

1 被引用数 (Scopus)

抄録

A combination of macroscale solidification simulation and phase-field calculation is employed to predict the volume fraction of the eutectic phase in Sn-4.0 mass%Ag-XCu solder alloys (X = 0.5-1.1 mass%). The solidification simulation incorporates the cooling rate in the phase-field simulation. We assume the residual liquid solidifies as eutectic phase when the driving force for the nucleation of Cu 6Sn 5 amounts to a critical value, which is determined based on the experimental data. Though the calculation results depend on the experimental data, the obtained fractions are about 40% for 0.5 mass%Cu and more than 90% for 1.1 mass%Cu alloy, which shows good agreement with the experimental data.

本文言語English
ページ(範囲)1969-1974
ページ数6
ジャーナルJournal of Electronic Materials
35
11
DOI
出版ステータスPublished - 2006 11月
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • 電子工学および電気工学
  • 材料化学

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