抄録
Amorphous Si/SiO2 quantum wells have been obtained at room temperature with atomic precision using magnetron sputtering. The Si/SiO 2 layer structure induces the higher optical transmittance at the visible wavelength region with increasing layer numbers. The tentative absorption coefficients are evaluated for integrated Si thicknesses. The absorption edge energy dependency on Si layer thickness E0 = 1.61 + 0.75d-2 is in accordance with effective mass theory for thicknesses 0.5 < d < 6nm. Quantum confinement effects of the Si/SiO2 nanostructure layer are confirmed from optical transmittance and reflectance spectra.
本文言語 | English |
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ページ(範囲) | 59-62 |
ページ数 | 4 |
ジャーナル | Journal of Nano Research |
巻 | 26 |
DOI | |
出版ステータス | Published - 2014 1月 6 |
ASJC Scopus subject areas
- 材料科学(全般)
- 物理学および天文学(全般)