Pairwise Coverage-Based Testing with Selected Elements in a Query for Database Applications

Koji Tsumura, Hironori Washizaki, Yoshiaki Fukazawa, Keishi Oshima, Ryota Mibe

    研究成果: Conference contribution

    7 被引用数 (Scopus)

    抄録

    Because program behaviors of database applications depend on the data used, code coverages do not effectively test database applications. Additionally, test coverages for database applications that focus on predicates in Structured Query Language (SQL) queries are not useful if the necessary predicates are omitted. In this paper, we present two new database applications using Plain Pairwise Coverage (PPC) and Selected Pairwise Coverage (SPC) for SQL queries called Plain Pairwise Coverage Testing (PPCT) and Selected Pairwise Coverage Testing (SPCT), respectively. These coverages are based on pairwise testing coverage, which employs selected elements in the SQL SELECT query as parameters. We also implement a coverage calculation tool and conduct case studies on two open source software systems. PPCT and SPCT can detect many faults, which are not detected by existing test methods based on predicates in the query. Furthermore, the case study suggests that SPCT can detect faults more efficiently than PPCT and the costs of SPCT can be further reduced by ignoring records filtered out by the conditions of the query.

    本文言語English
    ホスト出版物のタイトルProceedings - 2016 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016
    出版社Institute of Electrical and Electronics Engineers Inc.
    ページ92-101
    ページ数10
    ISBN(電子版)9781509018260
    DOI
    出版ステータスPublished - 2016 8月 1
    イベント9th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016 - Chicago, United States
    継続期間: 2016 4月 102016 4月 15

    Other

    Other9th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016
    国/地域United States
    CityChicago
    Period16/4/1016/4/15

    ASJC Scopus subject areas

    • ソフトウェア
    • 安全性、リスク、信頼性、品質管理

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