TY - JOUR
T1 - PIXE and PIXE-induced XRF for chemical specification
AU - Uda, M.
AU - Yamamoto, T.
PY - 1999/4/2
Y1 - 1999/4/2
N2 - Wavelength dispersive X-ray spectra with fine structures in the PIXE and PIXE-induced XRF spectra have been proved to be very much useful for chemical specification of condensed matters. The fine structures have been reproduced theoretically by introducing molecular orbital calculations, the shake-off and resonant orbital rearrangement (ROR) processes, together with the direct Coulomb interaction between projectiles and target atoms, and the self-absorption of emitted X-rays through the targets. Comparison between observed and theoretical spectra is given here for F and S atoms.
AB - Wavelength dispersive X-ray spectra with fine structures in the PIXE and PIXE-induced XRF spectra have been proved to be very much useful for chemical specification of condensed matters. The fine structures have been reproduced theoretically by introducing molecular orbital calculations, the shake-off and resonant orbital rearrangement (ROR) processes, together with the direct Coulomb interaction between projectiles and target atoms, and the self-absorption of emitted X-rays through the targets. Comparison between observed and theoretical spectra is given here for F and S atoms.
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U2 - 10.1016/S0168-583X(98)01087-8
DO - 10.1016/S0168-583X(98)01087-8
M3 - Conference article
AN - SCOPUS:0033515228
SN - 0168-583X
VL - 150
SP - 1
EP - 7
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
IS - 1-4
T2 - Proceedings of the 1998 8th International Conference on PIXE and its Analytical Applications
Y2 - 14 June 1998 through 18 June 1998
ER -