Polarimetric performance of Si/CdTe semiconductor Compton camera

Shin'Ichiro Takeda*, Hirokazu Odaka, Junichiro Katsuta, Shin Nosuke Ishikawa, So Ichiro Sugimoto, Yuu Koseki, Shin Watanabe, Goro Sato, Motohide Kokubun, Tadayuki Takahashi, Kazuhiro Nakazawa, Yasushi Fukazawa, Hiroyasu Tajima, Hidenori Toyokawa

*この研究の対応する著者

研究成果: Article査読

11 被引用数 (Scopus)

抄録

A Compton camera has been developed based on Si and CdTe semiconductor detectors with high spatial and spectral resolution for hard X- and γray astrophysics applications. A semiconductor Compton camera is also an excellent polarimeter due to its capability to precisely measure the Compton scattering azimuth angle, which is modulated by linear polarization. We assembled a prototype Compton camera and conducted a beam test using nearly 100% linearly polarized γrays at SPring-8.

本文言語English
ページ(範囲)619-627
ページ数9
ジャーナルNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
622
3
DOI
出版ステータスPublished - 2010 10月 21

ASJC Scopus subject areas

  • 器械工学
  • 核物理学および高エネルギー物理学

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