Pressure measurement method using laser ionization for xhv

K. Kokubun*, S. Ichimura, H. Shimizu, S. Sekine

*この研究の対応する著者

研究成果: Article査読

8 被引用数 (Scopus)

抄録

A pressure measurement method for xhv using laser ionization has been developed. By means of nonresonant multiphonon ionization, the proportional relation between the amount of laser-generated ions and the gas pressure is experimentally verified in the range 1 × 10-3-2 × 10-8 Pa. Also, a nonresonant 4-photon ionization of the He atom, which has the highest ionization potential of all atoms and molecules, and saturations of ionization for Xe, Kr, O2 and especially for H2, which is a main residual molecule in uhv and xhv, are successfully observed. In addition, a high-sensitivity ion-detection system for the exact measurement of several atoms and molecules in xhv is prepared. Noise due to scattered laser light is discussed.

本文言語English
ページ(範囲)657-659
ページ数3
ジャーナルVacuum
44
5-7
DOI
出版ステータスPublished - 1993 1月 1
外部発表はい

ASJC Scopus subject areas

  • 器械工学
  • 凝縮系物理学
  • 表面、皮膜および薄膜

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