抄録
The speed of the SET operation of a CuTa2O5Pt atomic switch from a high-resistance state to a low-resistance state was measured by transient current measurements under the application of a short voltage pulse. The SET time decreased exponentially with increasing pulse amplitude, reaching as low as 1 ns using moderate pulse voltages. This observation shows that oxide-based atomic switches hold potential for fast-switching memory applications. From a comparison with atomistic nucleation theory, Cu nucleation on the Pt electrode was found to be the likely rate-limiting process determining the SET time.
本文言語 | English |
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論文番号 | 032114 |
ジャーナル | AIP Advances |
巻 | 3 |
号 | 3 |
DOI | |
出版ステータス | Published - 2013 3月 |
外部発表 | はい |
ASJC Scopus subject areas
- 物理学および天文学(全般)