Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon and xenon doped with hydrogen

Shingo Kobayashi; Nobuyuki Hasebe; Takehiro Hosojima; Takeshi Ishizaki; Kazuhiro Iwamatsu; Mitsuteru Mimura; Takashi Miyachi; Mitsuhiro Miyajima; Kirill Pushkin; Chikara Tezuka; Tadayoshi Doke; Masanori Kobayashi; Eido Shibamura; Akihiro Ishizuka

doi:10.1143/JJAP.45.7894

Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon and xenon doped with hydrogen

Shingo Kobayashi^*, Nobuyuki Hasebe, Takehiro Hosojima, Takeshi Ishizaki, Kazuhiro Iwamatsu, Mitsuteru Mimura, Takashi Miyachi, Mitsuhiro Miyajima, Kirill Pushkin, Chikara Tezuka, Tadayoshi Doke, Masanori Kobayashi, Eido Shibamura, Akihiro Ishizuka

^*この研究の対応する著者

研究成果: Article › 査読

14 被引用数 (Scopus)

抄録

We have obtained the ratio of the transverse diffusion coefficient to the mobility of electrons multiplied by the elementary charge, in Xe and Xe + H ₂ under electric fields at a higher pressure of 1 MPa in comparison with those in preceding experiments. The results show that the density effect (nonlinear effect) of the ratio in both pure Xe and Xe + H₂ is ≤15% below 1 MPa over the reduced electric field range from 0.08 to 0.6 × 10^-17 V·cm². We also found that the diffusion of an electron swarm is suppressed by adding trace amount of hydrogen to high-pressure xenon gas. We discuss the application of Xe + H₂ gas to a new gamma-ray camera.

本文言語	English
ページ（範囲）	7894-7900
ページ数	7
ジャーナル	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
巻	45
号	10 A
DOI	https://doi.org/10.1143/JJAP.45.7894
出版ステータス	Published - 2006 10月 15

ASJC Scopus subject areas

物理学および天文学（その他）

文献へのアクセス

10.1143/JJAP.45.7894

他のファイルとリンク

引用スタイル

Kobayashi, S., Hasebe, N., Hosojima, T., Ishizaki, T., Iwamatsu, K., Mimura, M., Miyachi, T., Miyajima, M., Pushkin, K., Tezuka, C., Doke, T., Kobayashi, M., Shibamura, E., & Ishizuka, A. (2006). Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon and xenon doped with hydrogen. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 45(10 A), 7894-7900. https://doi.org/10.1143/JJAP.45.7894

Kobayashi, S, Hasebe, N, Hosojima, T, Ishizaki, T, Iwamatsu, K, Mimura, M, Miyachi, T, Miyajima, M, Pushkin, K, Tezuka, C, Doke, T, Kobayashi, M, Shibamura, E & Ishizuka, A 2006, 'Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon and xenon doped with hydrogen', Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, vol. 45, no. 10 A, pp. 7894-7900. https://doi.org/10.1143/JJAP.45.7894

@article{ce95461e8fa448b3b69a715bee0f256b,

title = "Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon and xenon doped with hydrogen",

abstract = "We have obtained the ratio of the transverse diffusion coefficient to the mobility of electrons multiplied by the elementary charge, in Xe and Xe + H 2 under electric fields at a higher pressure of 1 MPa in comparison with those in preceding experiments. The results show that the density effect (nonlinear effect) of the ratio in both pure Xe and Xe + H2 is ≤15% below 1 MPa over the reduced electric field range from 0.08 to 0.6 × 10-17 V·cm2. We also found that the diffusion of an electron swarm is suppressed by adding trace amount of hydrogen to high-pressure xenon gas. We discuss the application of Xe + H2 gas to a new gamma-ray camera.",

keywords = "Characteristic energy of electrons, High-pressure xenon gas, Hydrogen, Time projection chamber, Transverse diffusion coefficient",

author = "Shingo Kobayashi and Nobuyuki Hasebe and Takehiro Hosojima and Takeshi Ishizaki and Kazuhiro Iwamatsu and Mitsuteru Mimura and Takashi Miyachi and Mitsuhiro Miyajima and Kirill Pushkin and Chikara Tezuka and Tadayoshi Doke and Masanori Kobayashi and Eido Shibamura and Akihiro Ishizuka",

year = "2006",

month = oct,

day = "15",

doi = "10.1143/JJAP.45.7894",

language = "English",

volume = "45",

pages = "7894--7900",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "10 A",

}

TY - JOUR

T1 - Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon and xenon doped with hydrogen

AU - Kobayashi, Shingo

AU - Hasebe, Nobuyuki

AU - Hosojima, Takehiro

AU - Ishizaki, Takeshi

AU - Iwamatsu, Kazuhiro

AU - Mimura, Mitsuteru

AU - Miyachi, Takashi

AU - Miyajima, Mitsuhiro

AU - Pushkin, Kirill

AU - Tezuka, Chikara

AU - Doke, Tadayoshi

AU - Kobayashi, Masanori

AU - Shibamura, Eido

AU - Ishizuka, Akihiro

PY - 2006/10/15

Y1 - 2006/10/15

N2 - We have obtained the ratio of the transverse diffusion coefficient to the mobility of electrons multiplied by the elementary charge, in Xe and Xe + H 2 under electric fields at a higher pressure of 1 MPa in comparison with those in preceding experiments. The results show that the density effect (nonlinear effect) of the ratio in both pure Xe and Xe + H2 is ≤15% below 1 MPa over the reduced electric field range from 0.08 to 0.6 × 10-17 V·cm2. We also found that the diffusion of an electron swarm is suppressed by adding trace amount of hydrogen to high-pressure xenon gas. We discuss the application of Xe + H2 gas to a new gamma-ray camera.

AB - We have obtained the ratio of the transverse diffusion coefficient to the mobility of electrons multiplied by the elementary charge, in Xe and Xe + H 2 under electric fields at a higher pressure of 1 MPa in comparison with those in preceding experiments. The results show that the density effect (nonlinear effect) of the ratio in both pure Xe and Xe + H2 is ≤15% below 1 MPa over the reduced electric field range from 0.08 to 0.6 × 10-17 V·cm2. We also found that the diffusion of an electron swarm is suppressed by adding trace amount of hydrogen to high-pressure xenon gas. We discuss the application of Xe + H2 gas to a new gamma-ray camera.

KW - Characteristic energy of electrons

KW - High-pressure xenon gas

KW - Hydrogen

KW - Time projection chamber

KW - Transverse diffusion coefficient

UR - http://www.scopus.com/inward/record.url?scp=34547858528&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34547858528&partnerID=8YFLogxK

U2 - 10.1143/JJAP.45.7894

DO - 10.1143/JJAP.45.7894

M3 - Article

AN - SCOPUS:34547858528

SN - 0021-4922

VL - 45

SP - 7894

EP - 7900

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

IS - 10 A

ER -

Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon and xenon doped with hydrogen

抄録

ASJC Scopus subject areas

文献へのアクセス

他のファイルとリンク

フィンガープリント

引用スタイル