TY - GEN
T1 - Reduce test cost by reusing test oracles through combinatorial join
AU - Ukai, Hiroshi
AU - Qu, Xiao
AU - Washizaki, Hironori
AU - Fukazawa, Yoshiaki
PY - 2019/4
Y1 - 2019/4
N2 - Methods to generate combinatorial test suites have been extensively studied in the combinatorial interaction testing (CIT) community, but the creation of test oracles for the test cases remains a challenging and expensive task because they are created manually. In this paper, we propose a novel technique to 'join' multiple test suites into one while satisfying the required combinatorial coverage of the system under test. This technique allows test oracles designed and created in earlier testing phases to be reused in later ones. Our study results indicate that the technique can reduce the total test cost to design and execute a test suite by more than 55% compared to the conventional testing approach.
AB - Methods to generate combinatorial test suites have been extensively studied in the combinatorial interaction testing (CIT) community, but the creation of test oracles for the test cases remains a challenging and expensive task because they are created manually. In this paper, we propose a novel technique to 'join' multiple test suites into one while satisfying the required combinatorial coverage of the system under test. This technique allows test oracles designed and created in earlier testing phases to be reused in later ones. Our study results indicate that the technique can reduce the total test cost to design and execute a test suite by more than 55% compared to the conventional testing approach.
KW - Combinatorial interaction testing
KW - Functional testing
KW - Test oracle
UR - http://www.scopus.com/inward/record.url?scp=85068405073&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85068405073&partnerID=8YFLogxK
U2 - 10.1109/ICSTW.2019.00061
DO - 10.1109/ICSTW.2019.00061
M3 - Conference contribution
AN - SCOPUS:85068405073
T3 - Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019
SP - 260
EP - 263
BT - Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 12th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019
Y2 - 22 April 2019 through 27 April 2019
ER -