抄録
The proportion of reionized neutrals to the total scattering yield of rare-gas ions is reported for primary energies E0 from 0.1 to 2.0 keV. The measurements were made for several ion-target combinations by comparing the ion yield obtained from incidence of ions with that obtained from incidence of neutrals. The ration of the reionized neutrals to the total ion yield is strongly dependent on the combination of projectile ion and target atom. In some combinations, e.g. Ne on Sn for E0 > 1 keV and Ar on Ba for E0 > 0.5 keV, the reionized neutrals constitute the main part of the total ion yield, while the proportion of reionized Ne0 scattered from Au is very small and increases gradually with increasing E0.
本文言語 | English |
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ジャーナル | Surface Science |
巻 | 194 |
号 | 3 |
DOI | |
出版ステータス | Published - 1988 |
ASJC Scopus subject areas
- 物理化学および理論化学
- 凝縮系物理学
- 表面および界面