@inproceedings{3609c183df244a97add18590712bab33,
title = "Reliability of 2DEG Diamond FET by Harsh-Continuous Stress Voltage Approach",
abstract = "In this paper, a simple and time effective reliability stress measurement is done by continuous breakdown cycle method and continuous cycles of stress method under varying voltages.",
keywords = "FET, diamond, reliability, voltage stress",
author = "Nashaain, {N. M.} and S. Falina and Y. Kitabayashi and D. Matsumura and Manaf, {A. A.} and Z. Hassan and M. Syamsul and H. Kawarada",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 ; Conference date: 06-04-2020 Through 21-04-2020",
year = "2020",
month = apr,
doi = "10.1109/EDTM47692.2020.9117897",
language = "English",
series = "4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 - Proceedings",
}