RHEED intensity oscillation of C₆₀ growth on GaAs substrates

Intensity oscillation of reflection high-energy electron diffraction (RHEED) is observed during C₆₀ layer epitaxial growth on GaAs (1 1 1)B and (1 1 1)A substrates. The frequency of the oscillation coincides well with growth rate of C₆₀ layers, suggesting that C₆₀ layers grow with repeating nucleation and a step flow growth as with GaAs and other semiconductor materials. Unusual oscillation is observed in the initial C₆₀ layer growth on GaAs (1 1 1)B substrates with (2 × 2) reconstruction. The initial layer growth is completed at approximately half monolayer coverage by C₆₀ molecules. This phenomenon is explained by the model that C₆₀ absorption sites are limited due to As-trimers absorbed on (1 1 1)B surfaces. This model is strongly supported by the fact that no such effect is observed on GaAs (1 1 1)A substrates where no As-trimer is absorbed.