抄録
High quality BaTiO3 thin film epitaxially grown on a Nb-doped SrTiO3 (BTO/Nb-STO) substrate by a laser ablation technique is employed as a high-k gate insulator for a field-effect transistor of a rubrene single crystal in order to search for the possibility of high carrier accumulation. The high dielectric constant of 280 esu for the prepared BaTiO3 thin film accumulates 0.1 holes/rubrene-molecule, which is 2.5 times as high as the maximum carrier number of 0.04 holes/rubrene-molecule attained in the case of SiO2 gate insulator. Important parameters of rubrene single crystal FETs on BTO/Nb- STO are also described in comparison with those on SiO2/doped-Si.
本文言語 | English |
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ホスト出版物のタイトル | Materials Research Society Symposium Proceedings |
ページ | 270-275 |
ページ数 | 6 |
巻 | 965 |
出版ステータス | Published - 2006 |
外部発表 | はい |
イベント | 2006 MRS Fall Meeting - Boston, MA 継続期間: 2006 11月 27 → 2006 12月 1 |
Other
Other | 2006 MRS Fall Meeting |
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City | Boston, MA |
Period | 06/11/27 → 06/12/1 |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料