TY - GEN
T1 - Scan-based side-channel attack against symmetric key ciphers using scan signatures
AU - Fujishiro, Mika
AU - Shi, Youhua
AU - Yanagisawa, Masao
AU - Togawa, Nozomu
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/9/30
Y1 - 2015/9/30
N2 - There are a number of studies on a side-channel attack which uses information exploited from the physical implementation of a cryptosystem. A scan-based side-channel attack utilizes scan chains, one of design-for-test techniques and retrieves the secret information inside the cryptosystem. In this paper, scan-based side-channel attack methods against symmetric key ciphers such as block ciphers and stream ciphers using scan signatures are presented to show the risk of scan-based attacks.
AB - There are a number of studies on a side-channel attack which uses information exploited from the physical implementation of a cryptosystem. A scan-based side-channel attack utilizes scan chains, one of design-for-test techniques and retrieves the secret information inside the cryptosystem. In this paper, scan-based side-channel attack methods against symmetric key ciphers such as block ciphers and stream ciphers using scan signatures are presented to show the risk of scan-based attacks.
UR - http://www.scopus.com/inward/record.url?scp=84962184456&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84962184456&partnerID=8YFLogxK
U2 - 10.1109/EDSSC.2015.7285112
DO - 10.1109/EDSSC.2015.7285112
M3 - Conference contribution
AN - SCOPUS:84962184456
T3 - Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015
SP - 309
EP - 312
BT - Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015
Y2 - 1 June 2015 through 4 June 2015
ER -