Scan-based side-channel attack against symmetric key ciphers using scan signatures

Mika Fujishiro; Youhua Shi; Masao Yanagisawa; Nozomu Togawa

doi:10.1109/EDSSC.2015.7285112

Scan-based side-channel attack against symmetric key ciphers using scan signatures

Mika Fujishiro, Youhua Shi, Masao Yanagisawa, Nozomu Togawa

基幹理工学部

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

There are a number of studies on a side-channel attack which uses information exploited from the physical implementation of a cryptosystem. A scan-based side-channel attack utilizes scan chains, one of design-for-test techniques and retrieves the secret information inside the cryptosystem. In this paper, scan-based side-channel attack methods against symmetric key ciphers such as block ciphers and stream ciphers using scan signatures are presented to show the risk of scan-based attacks.

本文言語	English
ホスト出版物のタイトル	Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015
出版社	Institute of Electrical and Electronics Engineers Inc.
ページ	309-312
ページ数	4
ISBN（電子版）	9781479983636
DOI	https://doi.org/10.1109/EDSSC.2015.7285112
出版ステータス	Published - 2015 9月 30
イベント	11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015 - Singapore, Singapore 継続期間: 2015 6月 1 → 2015 6月 4

出版物シリーズ

名前	Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015

Other

Other	11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015
国/地域	Singapore
City	Singapore
Period	15/6/1 → 15/6/4

ASJC Scopus subject areas

電子工学および電気工学

文献へのアクセス

10.1109/EDSSC.2015.7285112

他のファイルとリンク

引用スタイル

Fujishiro, M., Shi, Y., Yanagisawa, M., & Togawa, N. (2015). Scan-based side-channel attack against symmetric key ciphers using scan signatures. In Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015 (pp. 309-312). 記事 7285112 (Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDSSC.2015.7285112

Scan-based side-channel attack against symmetric key ciphers using scan signatures. / Fujishiro, Mika; Shi, Youhua ; Yanagisawa, Masao その他.
Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 309-312 7285112 (Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015).

研究成果: Conference contribution

Fujishiro, M, Shi, Y , Yanagisawa, M & Togawa, N 2015, Scan-based side-channel attack against symmetric key ciphers using scan signatures. in Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015., 7285112, Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015, Institute of Electrical and Electronics Engineers Inc., pp. 309-312, 11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015, Singapore, Singapore, 15/6/1. https://doi.org/10.1109/EDSSC.2015.7285112

Fujishiro M, Shi Y , Yanagisawa M , Togawa N. Scan-based side-channel attack against symmetric key ciphers using scan signatures. In Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 309-312. 7285112. (Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015). doi: 10.1109/EDSSC.2015.7285112

Fujishiro, Mika ; Shi, Youhua ; Yanagisawa, Masao その他. / Scan-based side-channel attack against symmetric key ciphers using scan signatures. Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 309-312 (Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015).

@inproceedings{5951a56a3a68420a90eaba85dc328857,

title = "Scan-based side-channel attack against symmetric key ciphers using scan signatures",

abstract = "There are a number of studies on a side-channel attack which uses information exploited from the physical implementation of a cryptosystem. A scan-based side-channel attack utilizes scan chains, one of design-for-test techniques and retrieves the secret information inside the cryptosystem. In this paper, scan-based side-channel attack methods against symmetric key ciphers such as block ciphers and stream ciphers using scan signatures are presented to show the risk of scan-based attacks.",

author = "Mika Fujishiro and Youhua Shi and Masao Yanagisawa and Nozomu Togawa",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015 ; Conference date: 01-06-2015 Through 04-06-2015",

year = "2015",

month = sep,

day = "30",

doi = "10.1109/EDSSC.2015.7285112",

language = "English",

series = "Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "309--312",

booktitle = "Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015",

}

TY - GEN

T1 - Scan-based side-channel attack against symmetric key ciphers using scan signatures

AU - Fujishiro, Mika

AU - Shi, Youhua

AU - Yanagisawa, Masao

AU - Togawa, Nozomu

PY - 2015/9/30

Y1 - 2015/9/30

N2 - There are a number of studies on a side-channel attack which uses information exploited from the physical implementation of a cryptosystem. A scan-based side-channel attack utilizes scan chains, one of design-for-test techniques and retrieves the secret information inside the cryptosystem. In this paper, scan-based side-channel attack methods against symmetric key ciphers such as block ciphers and stream ciphers using scan signatures are presented to show the risk of scan-based attacks.

AB - There are a number of studies on a side-channel attack which uses information exploited from the physical implementation of a cryptosystem. A scan-based side-channel attack utilizes scan chains, one of design-for-test techniques and retrieves the secret information inside the cryptosystem. In this paper, scan-based side-channel attack methods against symmetric key ciphers such as block ciphers and stream ciphers using scan signatures are presented to show the risk of scan-based attacks.

UR - http://www.scopus.com/inward/record.url?scp=84962184456&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84962184456&partnerID=8YFLogxK

U2 - 10.1109/EDSSC.2015.7285112

DO - 10.1109/EDSSC.2015.7285112

M3 - Conference contribution

AN - SCOPUS:84962184456

T3 - Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015

SP - 309

EP - 312

BT - Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015

Y2 - 1 June 2015 through 4 June 2015

ER -

Scan-based side-channel attack against symmetric key ciphers using scan signatures

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