抄録
There are a number of studies on a side-channel attack which uses information exploited from the physical implementation of a cryptosystem. A scan-based side-channel attack utilizes scan chains, one of design-for-test techniques and retrieves the secret information inside the cryptosystem. In this paper, scan-based side-channel attack methods against symmetric key ciphers such as block ciphers and stream ciphers using scan signatures are presented to show the risk of scan-based attacks.
本文言語 | English |
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ホスト出版物のタイトル | Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015 |
出版社 | Institute of Electrical and Electronics Engineers Inc. |
ページ | 309-312 |
ページ数 | 4 |
ISBN(印刷版) | 9781479983636 |
DOI | |
出版ステータス | Published - 2015 9月 30 |
イベント | 11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015 - Singapore, Singapore 継続期間: 2015 6月 1 → 2015 6月 4 |
Other
Other | 11th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015 |
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国/地域 | Singapore |
City | Singapore |
Period | 15/6/1 → 15/6/4 |
ASJC Scopus subject areas
- 電子工学および電気工学