TY - GEN
T1 - Selection of metrics for predicting the appropriate application of design patterns
AU - Hernandez, Jonatan
AU - Kubo, Atsuto
AU - Washizaki, Hironori
AU - Yoshiaki, Fukazawa
N1 - Publisher Copyright:
Copyright 2011 ACM.
PY - 2011/10/5
Y1 - 2011/10/5
N2 - Design patterns are known for their usefulness to solve recurrent problems. Design patterns are a way of transmitting knowledge and experience by using proven, high quality solutions. A problem that emerges when using design patterns is that it is not clear how to measure the impact that has its application on the source code. The relationships between metrics and design patterns is not clear. We propose an experiment for measuring the usefulness of metrics and their success in predicting correct usage of design patterns. With this experiment we will explore which metrics capture best the relationship of design patterns quality of the source code. By using those metrics we will make predictions about the correct usage of the design patterns. In this experiment the selected metrics were not a good predictor, however it is a starting point to explore more metrics and their relationships with design patterns.
AB - Design patterns are known for their usefulness to solve recurrent problems. Design patterns are a way of transmitting knowledge and experience by using proven, high quality solutions. A problem that emerges when using design patterns is that it is not clear how to measure the impact that has its application on the source code. The relationships between metrics and design patterns is not clear. We propose an experiment for measuring the usefulness of metrics and their success in predicting correct usage of design patterns. With this experiment we will explore which metrics capture best the relationship of design patterns quality of the source code. By using those metrics we will make predictions about the correct usage of the design patterns. In this experiment the selected metrics were not a good predictor, however it is a starting point to explore more metrics and their relationships with design patterns.
KW - Design patterns
KW - Metrics
UR - http://www.scopus.com/inward/record.url?scp=84940646188&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84940646188&partnerID=8YFLogxK
U2 - 10.1145/2524629.2524633
DO - 10.1145/2524629.2524633
M3 - Conference contribution
AN - SCOPUS:84940646188
T3 - ACM International Conference Proceeding Series
BT - AsianPLoP 2011 - 2nd Asian Conference on Pattern Languages of Programs, Proceedings
PB - Association for Computing Machinery
T2 - 2nd Asian Conference on Pattern Languages of Programs, AsianPLoP 2011
Y2 - 5 October 2011 through 7 October 2011
ER -