TY - JOUR
T1 - Self-healing metal wire using an electric field trapping of gold nanoparticles for flexible devices
AU - Koshi, Tomoya
AU - Iwase, Eiji
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/2/26
Y1 - 2015/2/26
N2 - We developed a self-healing metal wire using an electric field trapping of gold nanoparticles. A cracked metal wire on a stretchable substrate can get its conductivity again by the self-healing function. In this paper, first, we theoretically analyzed force acting on a nanoparticle and calculated a critical voltage which cause the electric field trapping. Next, we fabricated gold wires with artificially patterned cracks on a glass substrate and verified the self-healing function by experiments of a crack healing. Finally, we demonstrated the self-healing of a cracked metal wire on a stretchable substrate to show a usefulness of the self-healing for flexible devices.
AB - We developed a self-healing metal wire using an electric field trapping of gold nanoparticles. A cracked metal wire on a stretchable substrate can get its conductivity again by the self-healing function. In this paper, first, we theoretically analyzed force acting on a nanoparticle and calculated a critical voltage which cause the electric field trapping. Next, we fabricated gold wires with artificially patterned cracks on a glass substrate and verified the self-healing function by experiments of a crack healing. Finally, we demonstrated the self-healing of a cracked metal wire on a stretchable substrate to show a usefulness of the self-healing for flexible devices.
UR - http://www.scopus.com/inward/record.url?scp=84931069816&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84931069816&partnerID=8YFLogxK
U2 - 10.1109/MEMSYS.2015.7050891
DO - 10.1109/MEMSYS.2015.7050891
M3 - Conference article
AN - SCOPUS:84931069816
SN - 1084-6999
VL - 2015-February
SP - 81
EP - 84
JO - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
JF - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
IS - February
M1 - 7050891
T2 - 2015 28th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2015
Y2 - 18 January 2015 through 22 January 2015
ER -