抄録
We have developed a technique for detecting single-ions that uses CR-39 plastic. Chemical etching of the plastic enables us to visualize both the incident sites and the existence of the single-ion incidences as etch pits. Using this technique, we obtained a singularity rate of 88.3%.
本文言語 | English |
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ページ(範囲) | 4536-4538 |
ページ数 | 3 |
ジャーナル | Review of Scientific Instruments |
巻 | 70 |
号 | 12 |
DOI | |
出版ステータス | Published - 1999 12月 |
外部発表 | はい |
ASJC Scopus subject areas
- 器械工学