抄録
The structural change of a 111In-labelled azobenzene derivative was examined using the interference effect of electron-capture X-rays emitted by nuclear transformations in radioactive atoms. Interference fringes were generated between the direct monochromatic emission from the radioactive atoms and the emission totally reflected by the substrate surface. The site of a radioactive atom can be determined by analysing the measured interference fringes, because the period of these fringes depends on the position of the radioactive atoms relative to the substrate surface.
本文言語 | English |
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ページ(範囲) | 456-458 |
ページ数 | 3 |
ジャーナル | Thin Solid Films |
巻 | 284-285 |
DOI | |
出版ステータス | Published - 1996 9月 15 |
外部発表 | はい |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 表面および界面
- 表面、皮膜および薄膜
- 金属および合金
- 材料化学