抄録
The microstructure of electroless-plated CoNiReP thin films in the initial deposition state were investigated by transmission electron microscopy (TEM), scanning electron microscopy (SEM) and scanning tunneling microscopy (STM). The films consisted of grains 30-50 nm in diameter. The result of STM observation presented a more detailed structure than that obtained by TEM and SEM. Also, the STM observation was effective in evaluating the minute structure of the films.
| 本文言語 | English |
|---|---|
| ページ（範囲） | L465-L467 |
| ジャーナル | Japanese journal of applied physics |
| 巻 | 28 |
| 号 | 3 A |
| DOI | |
| 出版ステータス | Published - 1989 3月 |
ASJC Scopus subject areas
- 工学（全般）
- 物理学および天文学（全般）