抄録
Direct observation of ZnSe-ZnTe strained layer superlattice was performed by transmission electron microscopy. The long periodicity of the superlattice was confirmed by the satellite spots of transmissin electron diffraction. The bright field TEM image indicated the superlattice structure without large scale misfit dislocations.
本文言語 | English |
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ページ(範囲) | 277-278 |
ページ数 | 2 |
ジャーナル | Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E |
巻 | E69 |
号 | 4 |
出版ステータス | Published - 1986 4月 |
外部発表 | はい |
イベント | Pap from 1986 Natl Conv IECE Jpn - Niigata, Jpn 継続期間: 1986 3月 23 → 1986 3月 26 |
ASJC Scopus subject areas
- 工学(全般)