TY - JOUR
T1 - Surface Change of Polyamide Nanocomposite Caused by Partial Discharges
AU - Kozako, Masahiro
AU - Fuse, Norikazu
AU - Shibata, Kohei
AU - Hirai, Naoshi
AU - Ohki, Yoshimichi
AU - Okamoto, Tatsuki
AU - Tanaka, Toshikatsu
PY - 2003/11/21
Y1 - 2003/11/21
N2 - We have investigated partial discharge (PD) degradation for conventional polyamide-6 without nanoscale fillers (nanofillers) and polyamide-6 nanocomposites with 2 weight (wt) %, 4 wt% and 5 wt% addition. Such materials were subjected to partial discharge under the IEC (b) electrode configuration for evaluation. Comparisons were made as to the surface roughness observed by scanning electron microscopy and atomic force microscopy. It was found that the change in the surface roughness was far smaller in specimens with nanofillers than those without nanofillers, and that the 2 wt% addition was sufficient for improvement. This result indicates that polyamide-6 nanocomposite is more resistive to PDs than polyamide 6 without nanofillers.
AB - We have investigated partial discharge (PD) degradation for conventional polyamide-6 without nanoscale fillers (nanofillers) and polyamide-6 nanocomposites with 2 weight (wt) %, 4 wt% and 5 wt% addition. Such materials were subjected to partial discharge under the IEC (b) electrode configuration for evaluation. Comparisons were made as to the surface roughness observed by scanning electron microscopy and atomic force microscopy. It was found that the change in the surface roughness was far smaller in specimens with nanofillers than those without nanofillers, and that the 2 wt% addition was sufficient for improvement. This result indicates that polyamide-6 nanocomposite is more resistive to PDs than polyamide 6 without nanofillers.
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M3 - Conference article
AN - SCOPUS:0242676021
SN - 0084-9162
SP - 75
EP - 78
JO - Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
JF - Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
T2 - 2003 Annual Report: Conference on Electrical Insulation and Dieletric Phenomena
Y2 - 19 October 2003 through 22 October 2003
ER -