Surface structure analysis of Zr-O/W(100) at high temperature by x-ray photoelectron diffraction

Keiji Tamura*, Mikiya Amano, Wei Guo Chu, Hideshi Ishii, Masanori Owari, Takashi Kawano, Takakiyo Nagatomi, Yoshizo Takai, Chuhei Oshima, Ryuichi Shimizu, Yoshimasa Nihei

*この研究の対応する著者

研究成果: Article査読

8 被引用数 (Scopus)

抄録

Temperature dependence of the surface structure of Zr-O/W(100) was obtained by low-energy electron diffraction observation to check the phase transition of the surface. After flashing the Zr-O/W(100) to 1500 K, the c(2 × 4) + c(4 × 2) double-domain structure was clearly observed at room temperature. This surface changed to the p(1 × 1) phase over 1300 K, accompanied by a decrease in the work function. The temperature dependence of the work function was obtained from the shift of the energy distributions of secondary electrons. The reversible phase transition of the Zr-O/W(100) surface and the decrease in the work function of 2 eV at high temperature were checked. X-ray photoelectron diffraction (XPD) measurements at 1500 K have been performed to investigate the surface structure at the working temperature of the Zr-O/W(100) electron emitter. The O1s XPED pattern included some patterns that can be regarded as the influence of Zr-O complexes on the W(100) surface.

本文言語English
ページ(範囲)217-220
ページ数4
ジャーナルSurface and Interface Analysis
37
2
DOI
出版ステータスPublished - 2005 2月

ASJC Scopus subject areas

  • 物理化学および理論化学
  • コロイド化学および表面化学

フィンガープリント

「Surface structure analysis of Zr-O/W(100) at high temperature by x-ray photoelectron diffraction」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル