抄録
The planar-view and cross-sectional microstructures of binary Sm-Fe magnetic thin films deposited on quartz glass substrates by the RF-sputtering method are investigated using a transmission electron microscope (TEM). The cross-sectional micrographs and TEM diffraction patterns show decent columnar structures in the films and special crystallographic orientations. The magnetic properties of Sm-Fe thin films can also be well explained by their microstructural characteristics.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 458-460 |
| ページ数 | 3 |
| ジャーナル | Journal of Electron Microscopy |
| 巻 | 45 |
| 号 | 5 |
| 出版ステータス | Published - 1996 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 器械工学